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Machine vision
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#	Item
721	ISSN (Print) : 2320 – 3765 ISSN (Online): 2278 – 8875 International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering (An ISO 3297: 2007 Certified Organization) Add to Reading List Source URL: www.ijareeie.com Language: English - Date: 2013-11-25 04:53:24 Image processing Computer vision Cluster analysis Geostatistics ECognition Synthetic aperture radar Change detection Segmentation Anomaly detection Statistics Data mining Machine learning
722	Author manuscript, published in "IEEE conf. on Computer Vision and Pattern Recognition, France (2012)" DOI : [removed]CVPR[removed]PCCA: A New Approach for Distance Learning from Sparse Pairwise Constraints Alexis Mi Add to Reading List Source URL: hal.archives-ouvertes.fr Language: English - Date: 2013-03-29 07:35:03 Multivariate statistics Nonlinear dimensionality reduction Isomap Kernel trick Dimension reduction Support vector machine Distance Multidimensional scaling Vector space Statistics Algebra Mathematics
723	IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, VOL. 25, NO. 6, JUNE 2003 Add to Reading List Source URL: www.iacl.ece.jhu.edu Language: English - Date: 2005-10-18 00:20:02 Mathematics Topology General topology Computer vision Computational science Active contour model Segmentation Marching squares Digital topology Computer-aided design Geometry Image processing
724	Facial Feature Tracking and Expression Recognition for Sign Language ˙Ismail Arı Computer Engineering Bo˜gazic.i University Add to Reading List Source URL: www.cmpe.boun.edu.tr Language: English - Date: 2009-10-28 13:45:29 Vision Face recognition Statistical classification Face detection Support vector machine Gesture recognition Pattern recognition Sign language Active appearance model Artificial intelligence Statistics Machine learning
725	Sysmac Automation Platform One control, one connection, one software One Machine Control Motion, Logic, Safety and Vision in one Add to Reading List Source URL: www.zomel.open.hr Language: English - Date: 2013-05-21 03:37:01 Industrial automation EtherCAT Beckhoff Motion control PROFINET SERCOS III EtherNet/IP SERCOS interface IEC 61131-3 Technology Industrial Ethernet Automation
726	Abstract : Scene mining is a subset of image mining in which scenes are classified to a distinct set of classes based on analysis of their content. In other word in scene mining, a label is given to visual content of sce Add to Reading List Source URL: www.science-of-medicine.netne.net Language: English - Date: 2013-02-01 20:19:58 Computer vision Science Data analysis Machine learning Natural language processing Feature extraction Cluster analysis Mining Association rule learning Statistics Data mining Artificial intelligence
727	POSITIONING \| IDENTIFICATION \| VERIFICATION \| MEASUREMENT \| FLAW DETECTION boa \| boa idr \| boa pro BOA Add to Reading List Source URL: www.imagessrl.com Language: English - Date: 2011-11-22 09:23:23 Sherlock Embedded system Machine vision Smart camera Artificial intelligence Boa
728	Nikos Paragios, Professor Updated: [removed]Current Position: Ecole Centrale de Paris (P1) D´epartement des Math´ematiques Appliqu´ees Add to Reading List Source URL: vision.mas.ecp.fr Language: English - Date: 2011-01-31 07:31:42 Knowledge Computer vision Nikos Paragios Stanley Osher IEEE Transactions on Pattern Analysis and Machine Intelligence Image analysis Institute of Electrical and Electronics Engineers Segmentation International Conference on Computer Vision Academia Science Image processing
729	Machine Vision and Applications[removed]:25–40 DOI[removed]s00138[removed]y O R I G I NA L PA P E R A system for articulated tracking incorporating a clothing model Add to Reading List Source URL: www.tnt.uni-hannover.de Language: English - Date: 2010-03-31 03:55:45 Computer vision Computational physics Robot kinematics Physics Computer graphics Pose Segmentation Inverse kinematics Motion capture 3D computer graphics Imaging Virtual reality
730	FOR IMMEDIATE RELEASE SolVision Merges with Machine Vision International to Deliver the Broadest Range of Advanced 2D/3D Inspection Solutions Across the Back-End Semiconductor Sector MONTREAL, CANADA – January 12, 200 Add to Reading List Source URL: www.entrepia.com Language: English - Date: 2008-10-09 18:42:31 Wafer Packaging and labeling Agilent Technologies Technology Semiconductor device fabrication Business

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